AFM Probes, Tips, and Cantilevers
AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to
FIT into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in surface analysis.
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AFM Probes, Tips, and Cantilevers - TipsNano г.
Дата публикации:
03 сент. 2017 - 22:21
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