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Calibration Gratings to buy

TipsNano Co supplies with the full set of calibration standards for AFM lateral and vertical calibration including submicron calibration in X or/and Y direction, test grating for the tip shape estimation, Highly Oriented Pyrolytic Graphite (HOPG), DNA and PFM test samples.

WWW http://tipsnano.ru, http://tipsnano.com/, http://afmnano.com
Calibration Gratings to buy

AFM Probes, Tips, and Cantilevers - TipsNano
AFM Probes, Tips, and Cantilevers - TipsNano
Budget AFM Cantilevers - Any Types Quality AFM Cantilevers
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Calibration Gratings to buy
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AFM Probes, Tips, and Cantilevers - TipsNano
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Дата публикации:
03 сент. 2017 - 23:17
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в Апреле [], всего [375]


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Diamond Coated Probes to buy
Diamond Coated Probes are the best choice for any kind of long-term electrical characterizations. Stable and nondestructive, wear resistant probes with diamond coating allow you to make as many...
Cantilever Sets to buy
New convenient format for probe puchasing.  Cantilever sets which include different probe series for research of different samples by various AFM modes. Cantilever sets is the perfect choice for...
The substrate for the samples of mica to buy
Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm. Mica Disks, 0.15 mm (0.006") thickness, size 9.5 mm diameter. Set of 10 substrates of polycrystalline sapphire.Size 24x19,3x0,5mm.
SNOM Fiber Probes to buy
SNOM PROBES - fiber probes with the formed aperture on the very tip end are specially designed for Scanning Near-Field Optical Microscopy. This method is used for investigating nanostructures at...
Highly Oriented Pyrolytic Graphite (HOPG)
Company TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG).  It's a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and...
AFM Probes, Tips, and Cantilevers
AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in...
High aspect ratio AFM cantilevers — TipsNano Tips
High Aspect RatioWhisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary...
Single Crystal Diamond
We would like to present you our new products - Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole...


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