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AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to
fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in...
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Цена договорная от 03.09.17г.
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Company
TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It's a type of pure, highly laminar graphite
used as an atomic-scale calibration standard for atomic force microscopy and...
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Цена договорная от 03.09.17г.
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High Aspect RatioWhisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary...
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Цена договорная от 03.09.17г.
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