Приемник+передатчик, 0-4,4метра. Используется для обнаружения очень мелких деталей-0,5-1ммProduct group W150, Through-beam photoelectric switchPart Number: 6011027Slotted masks (0.5 mm, 1 mm and 2...
AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to
fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in...