proelectro.ruВитрина продукцииСырье и материалы

SNOM Fiber Probes to buy

SNOM PROBES - fiber probes with the formed aperture on the very tip end are specially designed for Scanning Near-Field Optical Microscopy. This method is used for investigating nanostructures at sub-wavelength scale.

Probes are produced from standard single-mode Nufern fibers by the method of chemical etching that provides better optical efficiency in comparison with mechanical pulling.

Probes perform all current modes of SNOM operation - transmission, reflection and collection.

We offer 5 types of transmitted wavelength:

  • MF001 – 400-550 nm
  • MF002 – 450-600 nm
  • MF003 – 600-770 nm
  • MF004 – 780-970 nm
  • MF005 – 980-1600 nm


SNOM Fiber Probes to buy

AFM Probes, Tips, and Cantilevers - TipsNano
AFM Probes, Tips, and Cantilevers - TipsNano
Budget AFM Cantilevers - Any Types Quality AFM Cantilevers
При звонке сообщите, что нашли информацию на сайте «Проэлектро.ру»

SNOM Fiber Probes to buy
Сообщить о нарушении
Поставка:
Товар в наличии
Поставщик:
AFM Probes, Tips, and Cantilevers - TipsNano
г.
Дата публикации:
03 сент. 2017 - 23:25
Просмотров:
в Марте [], всего [386]


Продукция:
назад    вперед


Diamond Coated Probes to buy
Diamond Coated Probes are the best choice for any kind of long-term electrical characterizations. Stable and nondestructive, wear resistant probes with diamond coating allow you to make as many...
Cantilever Sets to buy
New convenient format for probe puchasing.  Cantilever sets which include different probe series for research of different samples by various AFM modes. Cantilever sets is the perfect choice for...
The substrate for the samples of mica to buy
Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm. Mica Disks, 0.15 mm (0.006") thickness, size 9.5 mm diameter. Set of 10 substrates of polycrystalline sapphire.Size 24x19,3x0,5mm.
Calibration Gratings to buy
TipsNano Co supplies with the full set of calibration standards for AFM lateral and vertical calibration including submicron calibration in X or/and Y direction, test grating for the tip shape...
AFM Probes, Tips, and Cantilevers
AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in...
High aspect ratio AFM cantilevers — TipsNano Tips
High Aspect RatioWhisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary...
Single Crystal Diamond
We would like to present you our new products - Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole...
New Development - Budget Compact Multifunctional AFM - HandyScan!
Advantages of HandyScan:Easy to useLower price as compared to most existing AFM systems – starting from 31 000€Self-installed (easy to install, detailed user guides allow to assemble and run the...


28121

Не нашли нужного предложения?
Оставьте заявку для всех участников торговой площадки.
24000 организации, Ваша контактная информация доступна только зарегистрированным пользователям.


Потребность:*
Актуальность:*
Дополнительная информация:
Контакты:*
Введите код указанный на картинке:*
 

- поля помеченные * обязательны для заполнения
- все заявки проходят модерацию




загрузка