|
Diamond Coated Probes are the best choice for any kind of long-term electrical characterizations. Stable and nondestructive, wear resistant probes with diamond coating allow you to make as many...
|
Цена договорная от 03.09.17г.
|
|
New convenient format for probe puchasing. Cantilever sets which include different probe series for research of different samples by various AFM modes.Cantilever sets is the perfect choice for...
|
Цена договорная от 03.09.17г.
|
|
Square mica, 0.15 mm (0.006") thickness, size 15 mm x 15 mm.Mica Disks, 0.15 mm (0.006") thickness, size 9.5 mm diameter.Set of 10 substrates of polycrystalline sapphire.Size 24x19,3x0,5mm.
|
Цена договорная от 03.09.17г.
|
|
TipsNano Co supplies with the full set of calibration standards for AFM lateral and vertical calibration including submicron calibration in X or/and Y direction, test grating for the tip shape...
|
Цена договорная от 03.09.17г.
|
|
SNOM PROBES - fiber probes with the formed aperture on the very tip end are specially designed for Scanning Near-Field Optical Microscopy. This method is used for investigating nanostructures at...
|
Цена договорная от 03.09.17г.
|
|
Advantages of HandyScan:Easy to useLower price as compared to most existing AFM systems – starting from 31 000€Self-installed (easy to install, detailed user guides allow to assemble and run the...
|
Цена договорная от 03.09.17г.
|
|
We would like to present you our new products - Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole...
|
Цена договорная от 03.09.17г.
|
|
AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to
fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in...
|
Цена договорная от 03.09.17г.
|
|
Company
TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It's a type of pure, highly laminar graphite
used as an atomic-scale calibration standard for atomic force microscopy and...
|
Цена договорная от 03.09.17г.
|
|
High Aspect RatioWhisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary...
|
Цена договорная от 03.09.17г.
|