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AFM Probes. AFM, Atomic Force Microscope, probes or tips are designed to
fit into most commercially available AFMs and outperform all other silicon SPM, Scanning Probe Microscope, probes used in...
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Цена договорная от 03.09.17г.
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High Aspect RatioWhisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary...
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Цена договорная от 03.09.17г.
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We would like to present you our new products - Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole...
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Цена договорная от 03.09.17г.
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TipsNano Co supplies with the full set of calibration standards for AFM lateral and vertical calibration including submicron calibration in X or/and Y direction, test grating for the tip shape...
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Цена договорная от 03.09.17г.
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SNOM PROBES - fiber probes with the formed aperture on the very tip end are specially designed for Scanning Near-Field Optical Microscopy. This method is used for investigating nanostructures at...
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Цена договорная от 03.09.17г.
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